This dataset collects all the data corresponding to the article entitled “Controlling magneto-ionics by defect engineering through light ion implantation"(Advanced Functional Materials, DOI: https://doi.org/10.1002/adfm.202312827). There is positron annihilation spectroscopy data on as-grown, as-implanted and as-treated (with voltage) films. There is also data on magnetoelectric data, taken by performing vibrating sample magnetometry on as-grown, as-implanted and as-treated (with voltage) films.
METHODOLOGICAL INFORMATION
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Description of methods used for collection-generation of data:
Reactive sputtering was used to grow the films. Ion implantation was used to further tune film microstructure. Vibrating sample magnetometry under voltage actuation through a liquid electrolyte was used for the magnetoelectric measurements. For the structural and compositional characterization, high-resolution transmission electron microscopy (HRTEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and electron energy loss spectroscopy (EELS)were used.
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Methods for processing the data:
The data files can be processed using Origin software.
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Instrument- or software- specific information needed to interpret the data:
To interpret the data, it is just needed to plot it.
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Instruments, calibration and standards information:
For the magnetometry measurements of the magnetoelectric data, the magnetometer was calibrated using a Ni standard.
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Environmental or experimental conditions:
The measurements were conducted in ambient conditions.
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Quality-assurance procedures performed on the data:
The results were carefully analyzed and interpreted. Peer review process of the corresponding scientific article by experts in this area has been done.