Temperature Dependence and Field Dependence Measurement of Muon in Normal and Damaged Double Strand DNA

DOI

Damages in DNA are known to be a root cause to numerous diseases that lead to ageing. Methylation is a type of DNA damage that occurs at high level in the brain tissue and affects the nature of electron transport in DNA. The extend of changes of electron mobility due to damages in DNA is not well quantified. In this proposal the effects of damages to electron mobility will be studied by comparing the electron mobility and topology in two synthetic double strand DNA samples; normal and damaged oligomers. The damage is in the form of methylation.

Identifier
DOI https://doi.org/10.5286/ISIS.E.RB1870037-1
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/103216173
Provenance
Creator Dr Dita Sari; Miss Suci Winarsih; Miss Siti Nuramira Abu Bakar; Dr Shukri Sulaiman; Miss Nur Eliana Ismail; Dr WAN NURFADHILAH BINTI ZAHARIM; Dr Ismail Mohamed-Ibrahim; Miss Harison Rozak; Dr Fahmi Astuti; Dr Isao Watanabe
Publisher ISIS Neutron and Muon Source
Publication Year 2022
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Biology; Biomaterials; Chemistry; Engineering Sciences; Life Sciences; Materials Science; Materials Science and Engineering; Natural Sciences
Temporal Coverage Begin 2019-06-25T09:30:00Z
Temporal Coverage End 2019-06-30T08:05:09Z