Probing the SEI on Si anodes using XRR

DOI

Operando XRR is used to probe in real time the formation of the SEI on model Si surfaces, thus providing valuable insights on the formation and evolution over the first few cycles of this interfacial layer.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-941275414
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/941275414
Provenance
Creator Samuel TARDIF ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2025
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields