Majorana zero-modes have been recently observed on superconductor–semiconductor nanowire networks for quantum computing devices. Networks with novel nanocrossed architectures are being explored because the logical operation can be controlled at nanowire junctions by charge braiding. In this context, special attention is given to the fabrication of InSb nanowires networks due to its strong spin-orbit interaction, which turns the control of qubit states faster. So far, the influence of the nanocross formation in the crystalline structure has not been investigated. This proposal envisages the use of scanning X-ray diffraction microscopy (SXDM) to obtain information about the structural lattice distortions present in the junctions formed by different nanowire architectures. We also intend to record spatially resolved lattice features around the intersection points by SXDM using an in operando approach (bias voltage) at the ID01 beamline.