Speckle-Based Dark Field at the Nanoscale

DOI

X-ray nanoscopy is an imaging approach that is expected to provide numerous answers regarding the structure of matter at the molecular level. Full-field X-ray imaging can reach such resolution if the setup is combined with strongly focusing optics capable of generating the desired magnification. In this kind of imaging approach, the phase contrast modality is preferred due to the fact that, at this scale, samples present very low absorption and therefore low contrast. To the best of our knowledge Dark Field (DF) has never been measured at spatial resolution better than a micron. The ambition of this proposal is to perform speckle-based imaging to extend the DF range to the nanoscale.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-1541958287
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/1541958287
Provenance
Creator Kim BAZOT ORCID logo; Clara MAGNIN; Julie VILLANOVA; Simon RIT ORCID logo; Rémi DUPRAZ-ROGET; Sam BAYAT ORCID logo; Emmanuel BRUN ORCID logo; Cécile OLIVIER; Marie-Christine ZDORA ORCID logo; Kaye MORGAN ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2027
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields