Šio darbo tikslai yra pagaminti stendą skirtą šviesos diodų elektrinių ir optinių triukšmų matavimo darbams, susipažinti su šviesos diodų triukšmų matavimo metodika, ištirti šviesos diodus triukšmų koreliacijos metodu, bei įvertinti jų triukšmų charakteristikų kitimą diodams senstant.

White light-emitting diodes were analyzed using noise correlation method. Samples were divided by the manufacturer into test samples to be analyzed and standard samples that were to be used for comparison. Electrical and optical fluctuations were measured at forward current range from 0,05 mA to 21 mA. Special attention was paid to the measurement of simultaneous correlation coefficient between electrical and optical fluctuations. Correlation coefficient was measured not only over the frequency range of 10 Hz to 20 kHz, but also in every one-octave frequency band. Analysis showed that at aging time t=0 h both samples had relatively the same amount of noise sources, however in the test sample a larger part of those noise sources were in the active layer of LED. Samples were then aged for 234 hours at forward current of 20 mA. At aging time t=234 h test sample’s noise level has increased to immeasurable levels. After aging standard sample retained the same amount of noise sources, however a part of those noise sources migrated from the peripheral layers into the active region of the LED.