Strain and Orientation Mapping of NiO Single Crystals and High Entropy Oxides Pellets

DOI

The aim of this proposal is to perform dark field X-ray microscopy (DFXM) to investigate lattice distortions, by probing local orientation and strain variations within bulk NiO and HEO pellets.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-511134177
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/511134177
Provenance
Creator Carsten Detlefs ORCID logo; Raquel RODRIGUEZ LAMAS ORCID logo; Can YILDIRIM ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2024
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields