RIXS characterization of sub-stoichiometric tungsten oxide films for transparent electric contacts

DOI

We propose employing RIXS characterization to qualify the electronic structure of sub-stoichiometric WO3-x thin films, in view of applications such as transparent electric contacts. Oxygen-deficient WO3-x exhibits high electrical conductivity, concurrently it displays enhanced optical absorption within the visible-to-NIR energy range, which poses challenges for optimal applications. We aim to verify the hypothesis that this enhanced optical absorption arises from d-d excitations within the W 5d states, facilitated by the increased nominal electronic configurations of 5d1 and 5d2 as a result of self-doping. Once our research results verify the hypothesis, they will yield a comprehensive understanding of the underlying mechanisms driving the enhanced optical absorption, thereby providing insights to mitigate this effect, and contributing to advance the utilization of WO3-x as transparent electric contacts.

Identifier
DOI https://doi.org/10.15151/ESRF-ES-2010922857
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/2010922857
Provenance
Creator Enrico BERGAMASCO ORCID logo; Marco MORETTI ORCID logo; SILVIA MARIA PIETRALUNGA ORCID logo; JULIA KUESPERT ORCID logo; Matteo BORGHESI; Hao CHEN ORCID logo; Lara PAETZOLD ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2028
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields