High energy characterization of interface for quantum applications

DOI

We will use the new set of lenses to focus the beam to submicron size and then perform the novel High-Enrgy X-Ray Reflectivity Tomography on different sample

Identifier
DOI https://doi.org/10.15151/ESRF-ES-1568754040
Metadata Access https://icatplus.esrf.fr/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatplus.esrf.fr:inv/1568754040
Provenance
Creator Ajay AJAY; Valentin VINCI; Jakub DRNEC ORCID logo; Olvido IRRAZABAL MOREDA ORCID logo; Andrea SARTORI ORCID logo
Publisher ESRF (European Synchrotron Radiation Facility)
Publication Year 2027
Rights CC-BY-4.0; https://creativecommons.org/licenses/by/4.0
OpenAccess true
Representation
Resource Type Data from large facility measurement; Collection
Discipline Particles, Nuclei and Fields