We propose to develop a new method to obtain direct space images, with ~30 nm resolution, of the atomic motion in GaN nanostructures. This new microscopy is based on the combination of Coherent Diffraction Imaging (to obtain direct space images) and resonant elastic scattering at forbidden reflections, which provides sensitivity to atomic motion, and is becoming possible thanks to the extreme brilliance of the new source. As a test case, we plan to investigate GaN nanopillars, where free surfaces, strain, crystal defects and inversion domain boundaries are expected to cause inhomogeneities of the atomic thermal motion.