We propose to acquire microscopic maps of the full strain tensor in suspended GeSn micro-disks that may be for infra-red optical emission. The main goal is to find evidence of shear strain that is detrimental to the device performance. It is not predicted by simulations but has been measured by destructive techniques such as electron microscopy which makes sample preparation a potential origin of the shear strain. The results will also help to bench-mark mechanical modeling and other techniques such as Raman scattering.