Element analyses blanks = below detection limit. Concentrations determined using a Merchantek/New Wave 213 nm Nd:YAG laser coupled with a VG/TJA PlasmaQuad ExCell ICP-MS at Boston University. Signals were generated from 50 micron rasters in thin sections, at laser energies of 1.2-2.0 mJ/pulse, at 10 pulses/s and 10-20 micron/s scan speed. These laser conditions typically resulted in ~ 100,000 cps for 139La in NIST 612 for a 50 micron spot. Signals were reduced by subtracting a blank (laser-off), correcting for yield using 43Ca as an internal standard (using the microprobe analyses for Ca in Table X), and calibrating to NIST 612 (values in Pearce et al., 1996). Spot-to-spot precision is <4% RSD for Sr, REE and U; 5-10% RSD for the other elements. Slow scan speeds, high energies, and transparent targets sometimes led to ablation of the underlying thin section glass. Analyses of 4 thin section glasses are given at the end of the table, and show significant concentrations of Rb, Ba and Pb. The effect of thin section contamination on U is small, however, as thin section glass is poor in U (< 0.5 ppm). Contamination may be calculated from the relatively constant Rb/U ratio in the thin section glass, and asusming zero Rb in the carbonate. These calculations reveal a trivial effect (< 4%, within analytical precision) on U for 63 out of the 83 analyses. Most of the others result in 20% and > 0.2 ppm U) are for inclusion-bearing calcite, where the Rb concentrations may be real.