62 datasets found

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library...

Pigment analyses were performed in March 2024, with additional data acquired in September 2024, at the Center for the Study of Manuscript Cultures (CSMC). The results are...

XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 150-200 µm steps and 22-30 ms per pixel), infrared reflectography (Osiris Apollo infrared camera, 150 mm,...

This dataset presents the multi-analytical results of pigment analysis from six Tibetan initiation cards in the Zhangzhung Nyengyü Tsakali collection. The color...

Dataset of the preliminary investigation of materials from the Hamburger Rotes Stadtsbuch RSH 111-1_92692 .  Devices used: Elio (Bruker/XGLab): 40 kV and 80...

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library...

Material analysis of inks from Byzantine manuscripts Research field “Artefact profiling” at the Cluster of Excellence “Understanding Written Artefacts”...

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel...

Presentation at the international colloquium INK-QUIRY Inks: between text and materiality, 11.12.2023, University Complutense of Madrid, Madrid (Spain). The research for this...

In this article, we present two Coptic papyri, P 11934 and P 11935 from the Berlin collection excavated in Ashmunein (ancient Hermopolis) by Otto Rubensohn in 1906. We employ a...

Presentation at the 4th International Congress of Archaeological Sciences in the Eastern Mediterranean and the Middle East, Nicosia (Cyprus), 05/2024. Recent research on the...

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library...

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from...

In the last two decades, the Bundesanstalt für Materialforschug und -prüfung (BAM), together with the Centre for the Study of Manuscript Cultures (CSMC, University of...

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library...

XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 70 to 200 µm steps and 40-50 ms per pixel) and  reflectography (DinoLite AD4113T-I2V: x40 magnification, vis,...

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran...

XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 200 µm steps and 25-30 ms per pixel) and  reflectography (DinoLite AD4113T-I2V: x40 magnification, vis, NIR...

This document shows a standardised system for the uniform file labelling of analytical data (spectroscopic measurements and spectral images) captured with instruments from the...

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and  reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis...