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X-ray Fluorescence and reflectography data of Ethiopian manuscript CHJN003
XRF (Artax: 50kV, 600 µA, linescans of 10 points of 50s each each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV... -
X-Ray Fluorescence and Reflectography Data from Milan, Ambrosian Library, Ms ...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Milan, Ambrosian... -
ICBS 2022 presentation: Material analysis of inks from Byzantine manuscripts
Material analysis of inks from Byzantine manuscripts Research field “Artefact profiling” at the Cluster of Excellence “Understanding Written Artefacts”... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 30-60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of pigments from miniatures of... -
X-Ray Fluorescence and Reflectography Data from Wolfenbüttel, Herzog August B...
XRF (ARTAX: 50kV, 600 µA, linescans of 10 points of 30s each) and reflectography (DinoLite: x50 magnification under vis, NIR and UV light) analysis of inks and pigments... -
X-Ray Fluorescence and Reflectography Data from Cambridge, Wren Library Ms B1...
XRF (Elio: 40kV, 100 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on... -
X-Ray Fluorescence Data from Diözesan- und Dombibliothek Köln Mss. Cod. 12 an...
XRF (Bruker Artax: 50kV, 600 µA, line measurements of 10 spots of 30s each) analysis of ink and pigments from Diözesan- und Dombibliothek Köln Mss. Cod. 12 (ca.... -
X-Ray Fluorescence and Visible Spectroscopy Data from Berlin, Staatsbibliothe...
XRF (ARTAX: 50kV, 600 µA, linescans of 10 points of 15s each), and Visible spectroscopy (SPM100, Gretag-Imaging AG: 380 nm to 730 nm) analysis of ink and pigments... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Libra...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
Multispectral Imaging Data from the "Tilburg fragment of the Fourth part of t...
Multispectral Imaging Data captured to recover damaged writing of the Tilburg fragment of the Fourth part of the Spiegel Historiael (Regionaal Archief Tilburg, arch.1111,... -
X-Ray Fluorescence, Reflectography, Visible Spectrophotometry, Fourier-transf...
X-Ray Fluorescence (ARTAX: 50kV, 600 µA, linescans of 10-20 points, diverse times used (10 to 100s), & spot analyses of 120s), FTIR (Exoscans, diffuse reflection...
