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X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Libra...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence Data from Zürich, Zürich Central Library Ms Rh. 131
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each) analysis of inks from Zurich Central Library Ms Rh. 131 (9th century CE) from Zürich Central Library... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th... -
XRF INK ANALYSIS OF SOME HERCULANEUM PAPYRI
Recent research has suggested that some of the inks used in Herculaneum papyri do not consist of pure carbon. Starting from this finding, in June 2018 a preliminary campaign of... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Parisinus Coislin... -
X-Ray Fluorescence Data from analysis of inks of wood blocks and prints from ...
XRF (Elio: 40kV, 80 µA, spot measurements of 60s each) analysis of inks from wood blocks and prints from the Rylands Library, Manchester...
