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X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
Multispectral Imaging Data from Samples for Research Project: "Quantitative M...
The goal of this research is the investigation of potentials and limits of UV-VIS-NIR Hyperspectral Imaging (HSI) and Multispectral Imaging (MSI) for the non-destructive... -
X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale...
XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Parisinus Coislin... -
Project: Khartasia: Online Database on Asian Papers
Project summary: Khartasia: Online Database on Asian Papers -
X-Ray Fluorescence, Reflectography, Visible Spectrophotometry, Fourier-transf...
X-Ray Fluorescence (ARTAX: 50kV, 600 µA, linescans of 10-20 points, diverse times used (10 to 100s), & spot analyses of 120s), FTIR (Exoscans, diffuse reflection... -
X-Ray Fluorescence Data from analysis of inks of wood blocks and prints from ...
XRF (Elio: 40kV, 80 µA, spot measurements of 60s each) analysis of inks from wood blocks and prints from the Rylands Library, Manchester...